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  4. Charged Residues at the First Transmembrane Region Contribute to the Voltage Dependence of the Slow Gate of Connexins
Details

Charged Residues at the First Transmembrane Region Contribute to the Voltage Dependence of the Slow Gate of Connexins

Journal
Journal of Biological Chemistry
ISSN
0021-9258
Date Issued
2016
Author(s)
Bernardo I. Pinto
Isaac E. García
Amaury Pupo
RETAMAL LUCERO, MAURICIO ANTONIO  
Facultad de Medicina Clínica Alemana Universidad del Desarrollo  
Agustín D. Martínez
Ramón Latorre
Carlos González
Type
Resource Types::text::journal::journal article
Scopus ID
2-s2.0-84979220465
WoS ID
WOS:000380584200027
DOI
10.1074/jbc.M115.709402
URL
https://investigadores.udd.cl/handle/123456789/3202
URL Institutional Repository
http://hdl.handle.net/11447/914
Project(s)
Sensor de Voltaje de canales de Iones: desde la estructura a la función  
Carbon monoxide inhibits Cx46 HCs through a lipid peroxidation-dependent process which increases Cx46- Ca2+ sensitivity  
Subjects
gap junctional communication

; 

conformational-changes

; 

potassium channel

; 

molecular-basis

; 

hemichannels

; 

cloning

; 

domain

; 

mouse

; 

pore

; 

selectivity
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